Home > News > Ascend claims breakthrough to simplify TAM analysis
September 29th, 2004
Ascend claims breakthrough to simplify TAM analysis
Abstract:
Ascend Instruments Inc. on Wednesday (Sept. 29) claimed to have devised a new technique that eliminates most of the steps in transmission electron microscopy (TAM), based on focused ion beam (FIB) technology.
Ascend Instruments
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* siliconstrategies
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