Home > News > FEI Launches Top-of-the-Line Research Dualbeam
September 1st, 2006
FEI Launches Top-of-the-Line Research Dualbeam
Abstract:
The next generation of combined focused ion beam (FIB) and scanning electron microscope (SEM) technology for research will be unveiled today when FEI Company (Nasdaq: FEIC) releases its all-new Helios NanoLab(TM) DualBeam(TM) at Microscopy and Microanalysis 2006 in Chicago.
Source:
thomasnet.com
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